Your road map for meeting today? s digital testing challenges Today, digital logic devices are common in products that affect public safety, including applications in transportation and human implants. However, because digital systems become more numerous and complicated, the challenge of testing them has become more difficult. Reference honored for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. Digital Logic Testing and Simulation, Second Edition covers key topics such as: Binary Decision Diagrams (BDDs) and cycle-based simulation Tester architectures / Standard Test Interface Language (stil) Practical algorithms written in a Hardware Design Language (HDL) Fault tolerance Behavior Automatic Test Pattern Generation (ATPG) Development of Test Design Expert (TDX), many obstacles faced and lessons in creating a new testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important source for anyone who is charged with determining the defective products and ensure quality, safety, and profitability.