Today electronics design and test engineers deal with several types of subsystems, namely memory, digital, and mixed-signal, each requiring different test and design for testability methods. This book consists of: Part I: Introduction, Test Process and ATE, Test Economics and Product Quality, Fault Modeling; Part II: Logic and Fault Simulation, Testability Measures, Combinatorial ATPG, Sequential ATPG, Memory Test, Analog Test DSP-Based, Model-Based Analog Test, Delay Test, IDDQ Test; Part III: DFT and Scan Design, BIST, Boundary Scan, Analog Test Bus, System Test and Core-Based Design, Future Testing; Appendix: Cyclic Redundancy Code Theory, Primitive polynomials, Books on Testing; Bibliography: more than 700 entries.